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Measurement Technology and Intelligent Instruments VIII

Key Engineering Materials Volumes 381 - 382

• Papers
• Abstracts

• p3 Engineering Nanotechnology: The Top Down Approach   [ 643 K ]
  Authors: Robert J. Hocken, R. Fesperman, J. Overcash, O. Ozturk, C. Stroup
• p7 Dimensional Measurements for Micro- and Nanotechnology   [ 229 K ]
  Authors: Gao Liang Dai, F. Pohlenz, H.U. Danzebrink, L. Koenders
• p11 Recent Advances in our Research on Ultrahigh Resolution Laser Confocal Microscopy   [ 236 K ]
  Authors: Jiu Bin Tan, Jian Liu
• p15 Reliable Detection of Periodic Micro Structures on Open Surfaces   [ 283 K ]
  Authors: F. Härtig, Michael Paul Krystek, S. Klein
• p19 The Assessment of Functional Properties of Surfaces with Morphological Operations   [ 927 K ]
  Authors: Michael Dietzsch, S. Gröger, M. Gerlach, Michael Paul Krystek
• p23 Tactile and Optical Microsensors - Test Procedures and Standards   [ 2 M ]
  Authors: Ulrich Neuschaefer-Rube, Michael Neugebauer, W. Ehrig, M. Bartscher, U. Hilpert
• p27 Simulation of Light Scattering from Nanostructured Surfaces   [ 731 K ]
  Authors: Andreas Tausendfreund, S. Patzelt, S. Simon, G. Goch
• p31 Characterization and Manipulation of Boron Nanowire inside SEM   [ 229 K ]
  Authors: Ming Chang, C.H. Lin, Juti Rani Deka
• p35 AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces   [ 3 M ]
  Authors: Yu Guo Cui, Bing Feng Ju, J. Aoki, Yoshikazu Arai, Wei Gao
• p39 Compact Displacement Measurement System Based on Microchip Nd:YAG Laser with Birefringence External Cavity   [ 269 K ]
  Authors: Y. Tan, S. Zhang