Electrical Properties of (1–x)(0.8PMN-0.2PNN)-xPT Ceramics near the Morphotropic Phase Boundary

Guo Yuan Zhou; Jin Song Pan; Xiao Wen Zhang

doi:10.4028/www.scientific.net/KEM.336-338.18

Paper Titles

Processing, Properties and Possible Applications of PZT-Based Thin Films
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High Piezoelectric Property and Low Dielectric Constant PZN-PZT Ceramics
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Molten Salts Synthesis of Relaxor Ferroelectrics PMN-PT Powders
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Effect of PbO-Based Glass Frit Additives on Physical and Electrical Properties of 0.125PMN-0.875PZT Piezoelectric Ceramics near the Morphotropic Phase Boundary
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Electrical Properties of (1–x)(0.8PMN-0.2PNN)-xPT Ceramics near the Morphotropic Phase Boundary
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Effects of Rare Earth Gd Doping on Ferroelectric Properties of PbZr_0.52Ti_0.48O₃ Thin Films Prepared by Sol–Gel Methods
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<001> Textured Pb(Mg_1/3Nb_2/3)O₃–PbTiO₃ Ceramics Prepared by Reactive Templated Grain Growth
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The Effect of Zn²⁺ Deficiency on Ordered Micro-Regions and Dielectric Properties of Pb(Zn_1/3Nb_2/3)O₃-Based Relaxor Ceramics
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Structure and Electrical Properties of Pb(Ni_1/3Nb_2/3)O₃-Pb(Zr/Ti)O₃ Relaxors
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 336-338Electrical Properties of (1–x)(0.8PMN-0.2PNN)-xPT...

Electrical Properties of (1–x)(0.8PMN-0.2PNN)-xPT Ceramics near the Morphotropic Phase Boundary

Abstract:

Ferroelectric ceramics of (1x)(0.8PMN0.2PNN)xPT (x = 0.280.43) were synthesized by the columbite precursor method. Their phase structures as well as the dielectric, ferroelectric and piezoelectric properties were investigated. X-ray diffraction (XRD) results demonstrate that the morphotropic phase boundary (MPB) of this system lies in the composition range of x = 0.31–0.37. Examination of the dielectric behavior indicates that the ceramics exhibit high dielectric constants near the MPB compositions. In addition, the piezoelectric properties of the ceramics were found quite well around the MPB. The interrelated mechanism was also discussed.