Residual Stresses VII
Materials Science Forum Volumes 524 - 525
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p717
Effect of Surface Nano Crystallization on Tribological Properties of Stainless Steel
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190 K
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Authors: T. Roland, Delphine Retraint, K. Lu, Jian Lu -
p723
Stresses Analysis on Coarse Grain Zn Film during Tensile Loading
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404 K
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Authors: Wen Jun Huang, Vincent Ji, Wilfrid Seiler -
p729
Scratch Test of TiCN Thin Films with Different Preferred Orientation
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275 K
]
Authors: Hiroshi Goto, Masahide Gotoh, Shouichi Ejiri, Yoshiaki Horimoto, Yukio Hirose -
p735
Strains, Stresses and Elastic Properties in Polycrystalline Metallic Thin Films: In Situ Deformation Combined with X-Ray Diffraction and Simulation Experiments
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1 M
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Authors: Philippe Goudeau, Damien Faurie, Baptiste Girault, Pierre Olivier Renault, Eric Le Bourhis, Pascale Villain, Frederic Badawi, Olivier Castelnau, Rénald Brenner, Jean Luc Béchade, G. Geandier, Nobumichi Tamura -
p743
Oxford HEXameter: Laboratory High Energy X-Ray Diffractometer for Bulk Residual Stress Analysis
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223 K
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Authors: Alexander M. Korsunsky, Shu Yan Zhang, Daniele Dini, Willem J.J. Vorster, Jian Liu -
p749
A New Type of X-Ray Diffractometer with Cooperating Robots for Residual Stress Analysis on Large Components
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1 M
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Authors: Roland Hessert, Wilhelm Satzger, Alfried Haase, Achim Schafmeister -
p755
Effect of Detector Width and Peak Location Technique on Residual Stress Determination in Case of Work-Hardened Materials
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269 K
]
Authors: M. Belassel, Eliane Bocher, J. Pineault -
p761
Specific Corrections Associated to Linear CCD Detectors Used in X-Ray Diffraction
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357 K
]
Authors: C. Ferreira, Manuel François, Ronald Guillén -
p769
Internal Stress Development during Fatigue Cycling of High-Strength Al/SiC Metal Matrix Composites
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4 M
]
Authors: Michael E. Fitzpatrick -
p775
Effective Stresses and Plastic Strain Rates in a Superalloy: a High Temperature In Situ Study by Synchrotron X-Ray TCD
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218 K
]
Authors: Alain Jacques, Olivier Ferry, Frédéric Diologent, Pierre Caron, Pierre Bastie
