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Stresses Analysis on Coarse Grain Zn Film during Tensile Loading

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Abstract:

The advance of the XRD technique allows us to reach the properties of each coarse grain. This paper has demonstrated a new method to determine stress in a single crystal for multicrystal material and this new method could be specially applied for any symmetric crystalline systems. The strain tensor ε is determined by the change of the metric tensor G before the initial state and after the deformed state in the crystal reference system. Then stress tensor at grain scale is calculated by the Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coating on a steel substrate during tensile loading. This study allows us to link the microstructure evolution to the elastic heterogeneity at grain scale or between the grains.

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Periodical:

Materials Science Forum (Volumes 524-525)

Pages:

723-728

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.524-525.723

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Online since:

September 2006

Authors:

Wen Jun Huang, Vincent Ji, Wilfrid Seiler

Keywords:

Multi-Crystals, Single Crystal, Stress Analysis, Tensile Loading, X-Ray Diffraction (XRD), Zinc

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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