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Measuremet of Mechanical Properties of Thin Films and Nanostructured Materials at High Spatial Resolution

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Abstract:

The development of nanostructured materials and coatings has driven the development of indentation-based assessment techniques which aim to generate useful mechanical property information. This paper introduces an approach to determine the limits for which direct measurement of these properties are possible and highlights the importance of modelling if reliable data is to be obtained from very thin coatings (<200nm) and fine grained materials.

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Periodical:

Materials Science Forum (Volumes 539-543)

Pages:

3534-3539

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.539-543.3534

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Online since:

March 2007

Authors:

S.J. Bull

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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