Preparation of FeCoZrBCu Thin Films and their Effect of Microstructure on Magnetic Properties

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Abstract:

In this work, (Fe,Co)–Zr–B–Cu films have been deposited on glass and Si substrates by DC magnetron sputtering method. X-ray diffraction analysis was used to identify the structure of the films. A transmission electron microscope (TEM) was employed to observe the microstructure for the films. Magnetic properties at room temperature were investigated by a Vibrating Sample Magnetometer (VSM). It was obtained that the as-deposited films on glass and Si substrates were in an amorphous state. In addition, it has been found that the coercivity is dependent on film thicknesses.

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Materials Science Forum (Volumes 546-549)

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2163-2166

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May 2007

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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[1] Y. Yoshizawa, S. Oguma and K. Yamauchi: J. Appl. Phys.: 64 (1999) 6044.

Google Scholar

[2] K. Suzuki, N. Kataoka, A. Inoue, A. Makino, T. Masumoto: Mater. Trans. JIM: 31 (1990) 743.

Google Scholar

[3] K. Suzuki, N. Kataoka, A. Inoue: Muter. Trans. JIM: 32 (1991) 93.

Google Scholar

[4] M. A. Willard, D. E. Laughlin, M. E. McHenry, D. Thoma, K. Sickafus, J. 0. Cross, and V. G. Harris: J. Appl. Phys.: 84 (1998) 6773.

Google Scholar

[5] M. A. Willard, M. -Q. Huang, D. E. Laughlin, M. E. McHenry, J. O. Cross, V. G. Harris, and C. Franchetti: J. Appl. Phys.: 85 (1999) 4421.

Google Scholar

[6] M. Kopcewicz, A. Grabias, M. A. Willard, D. E. Laughlin, and M. E. McHenry: IEEE Transations on magnetics: 37 (2001) 2226.

Google Scholar

[7] Frank Johnson, Amy Hsaio, Colin Ashe, David Laughlin, David Lambeth: IEEE Nano, Nanomagnetics 1 (Special session): (2001).

Google Scholar

[8] J.S. Blázquez, C.F. Conde, A. Conde, J.M. Grenèche: Journal of Alloys and Compounds: 36 (2004) 370.

Google Scholar

[9] S. Kumar, T. Ohkubo, and D. E. Laughlin: J. Appl. Phys.: 91 (2002) 8360.

Google Scholar