Paper Titles
Code Translator of STEP-NC Based on ISO14649
p.498
Triangular Surface Reconstruction of CT Images by Using Isosurface Construction
p.503
The Controller of Vision Detecting Instrument for Steel Ball Surface Quality Based on DSP
p.508
An Integrated Approach for the Realization of the Real-Time Control in Electro-Hydraulic Servo System
p.513
Design of Displacement Measuring System for Nano-Hardness Test Device
p.518
Systems Analysis for Commercial Aircraft Flight Simulator
p.522
Research of the Static Balance for Spherical Rotor
p.528
Research on a New Nanohardness Test Device
p.533
Development of a Self-Feedback Adjustment Piezoelectric Ceramic Power Supply
p.538

Design of Displacement Measuring System for Nano-Hardness Test Device

Article Preview

Abstract:

Nano-hardness test device has the ability to make the load-displacement measurement with sub-nanometer indentation depth sensitivity, and the nanohardness of the material can be got from the load-displacement curve by Oliver-Pharr method. In order to measure the small displacement accurately, we designed a capacitive displacement measuring system. This capacitance micrometer has a resolution of 0.1nm, and is suitable for our nano-hardness test device.

You might also be interested in these eBooks
e-Engineering & Digital Enterprise Technology View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 10-12)

Pages:

518-521

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.10-12.518

Citation:

Cite this paper

Online since:

December 2007

Authors:

Qiang Liu, Ying Xue Yao, L. Zhou

Keywords:

Capacitance Micrometer, Nano Hardness, Oliver Pharr Method

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2008 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

References

[1] W. C Oliver, G. M Pharr: J Mater Res, Vol. 7 (1992) No. 6, p.1564.

Google Scholar

[2] J.W. Li, S.L. Liu and J.Y. F: Journal of Tianjin University, Vol. 37 (2004) No. 9, pp.787-791.

Google Scholar

[3] Q.W. Shi, T. Zhou, Y.Z. Zheng: Modern Instruments, Vol. 6 (2005) No. 3, pp.48-50.

Google Scholar

[4] S.Z. Zhao, Z.Y. Zheng: China Measurement Technology, Vol. 6 (2003) No. 5, pp.7-9.

Google Scholar

[5] J.W. Li, J.Y. Fu and H.G. Zhang: Acta Metrologica Sinica, Vol. 22 (2001) No. 3, pp.181-184.

Google Scholar