HOME CONTACT

Username: Password:

> @scientific.net

Defects in Semiconductors 14

Materials Science Forum Volumes 10 - 12

• Papers
• Abstracts

• p821 On the Mobility of 1/6 (112) Partial Dislocations under High Stress in Semi-Insulating GaAs   [ 545 K ]
  Authors: Y. Androussi, P. François, J. Di Persio, G. Vanderschaeve, A. Lefebvre
• p827 ODMR Observation of Close Frenkel Pairs in Electron-Irradiated ZnSe   [ 305 K ]
  Authors: F. Christopher Rong, G.D. Watkins
• p833 Electrical Compensation, Electron and Hole Traps in Electron Irradiated ZnSe   [ 205 K ]
  Authors: A. Heurtel, R. Legros, Y. Marfaing, R. Triboulet
• p839 Radiation Damage Experiments with ZnO at Low Temperatures   [ 267 K ]
  Authors: G. Pazionis, H.-J. Schulz
• p845 Saturation Spectroscopy and Fluorescence in ZnO:Co²⁺   [ 178 K ]
  Authors: R.M. Macfarlane, Jean Claude Viala
• p851 ODMR-MCD Study of the Zinc Vacancy and Related Complexes in ZnSe   [ 325 K ]
  Authors: D.Y. Jeon, H.P. Gislason, G.D. Watkins
• p857 Photoluminescence Spectroscopy of Proton Implantation Induced Defects in CdTe and ZnTe   [ 214 K ]
  Authors: L. Svob, Y. Marfaing
• p863 Acceptors and Donors in the Wide-Gap Semiconductors ZnO and SnO₂   [ 178 K ]
  Authors: Herbert Wolf, S. Deubler, Doris Forkel-Wirth, H. Foettinger, M. Iwatschenko-Borho, F. Meyer, M. Renn, W. Witthuhn, Reinhard Helbig
• p869 On the Influence of Doping and Annealing on Oxygen-Related Defects in Silicon   [ 207 K ]
  Authors: Peter Mascher, S. Dannefaer, D. Kerr, S.K. Hahn
• p875 The Electronic Structure of the Oxygen-Vacancy Complex in Silicon   [ 249 K ]
  Authors: R. Van Kemp, E.G. Sieverts, C.A.J. Ammerlaan