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Defects in Semiconductors 14

Materials Science Forum Volumes 10 - 12

• Papers
• Abstracts

• p193 Capacitance and Current Spectroscopy of Perpendicular Transport in Compensated GaAs-GaAlAs Superlattices   [ 298 K ]
  Authors: H. Sibille, J.F. Palmier, H. Le Person
• p199 Characterization of Electron Traps in GaAs-GaAlAs Superlattices   [ 224 K ]
  Authors: F. Sillion, A. Mauger, J.C. Bourgoin, B. Deveaud, A. Regreny, D. Stiévenard
• p205 Defect Generation in the Initial Stages of Epitaxial Growth of GaAs on Silicon by MBE   [ 908 K ]
  Authors: F.A. Ponce, D.K. Biegelsen, J.C. Tramontana, A.J. Smith
• p211 Atomic Imaging of Surface Defects on Si   [ 353 K ]
  Authors: J.E. Demuth, R.J. Hamers, R.M. Tromp
• p217 Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction   [ 326 K ]
  Authors: A. Ourmazd, D.W. Taylor, J. Bevk, B.A. Davidson, Leonard C. Feldman, J.P. Mannaerts
• p223 Deep Level at Semiconductor Surfaces   [ 183 K ]
  Authors: W. Platen, D. Kohl, K.A. Brauchle, K. Wolter
• p229 Charged Defect States at Silicon Grain Boundaries   [ 278 K ]
  Authors: F.J. Stützler, L. Tapfer, H.J. Queisser
• p235 Bulk and Grain Boundary Defects in Polycrystalline ZnO   [ 275 K ]
  Authors: Felix Greuter, G. Blatter, M. Rossinelli, F. Schmückle
• p241 The Role of Defect Production at Surface and Interface of CdHgTe and ZnHgTe   [ 283 K ]
  Authors: Tsunemasa Taguchi, Toshiyuki Terada, Osamy Ohno, Tokuhito Sasaki, Muneyoshi Suita, Akio Hiraki
• p247 Electronic Structure of As and P Antisite Defects and Ga Vacancy in GaP and GaAs   [ 218 K ]
  Authors: S. Biernacki