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Defects in Semiconductors 15

Materials Science Forum Volumes 38 - 41

• Papers
• Abstracts

• p335 Fluorine-Silicon Reactions and the Etching of Crystalline Silicon   [ 250 K ]
  Authors: Chris G. Van de Walle, F.R. McFeely, Sokrates T. Pantelides
• p341 Photothermal Ionization Spectroscopy   [ 748 K ]
  Authors: Hermann G. Grimmeiss, Mats Kleverman, J. Olajos
• p355 The Electronic Structure of Platinum, Palladium and Nickel in Silicon   [ 194 K ]
  Authors: A.B. van Oosten, N.T. Son, L.S. Vlasenko, C.A.J. Ammerlaan
• p361 Time Resolved Photoluminescence Measurements on Noble Gas Related Defects in Silicon   [ 217 K ]
  Authors: G. Bohnert, A. Hangleiter, K. Weronek, Klaus Thonke
• p367 Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon   [ 233 K ]
  Authors: Manfred Deicher, G. Grübel, R. Keller, E. Recknagel, N. Schulz, H. Skudlik, Th. Wichert
• p373 Electronic Characterization of Defects in Iron-Doped P-Type Silicon   [ 247 K ]
  Authors: W. Gehlhoff, K. Irmscher, U. Rehse
• p379 Photoluminescence from Defects in Silicon Grown by Molecular Beam Epitaxy   [ 272 K ]
  Authors: Edward C. Lightowlers, M.J. Gregson, V. Higgs, S.T. Davey, C.J. Gibbings, C.G. Tuppen
• p385 Electronic Energy Level of Off-Center Substitutional Nitrogen in Silicon   [ 198 K ]
  Authors: Kouichi Murakami, Hitoshi Kuribayashi, Kohzoh Masuda
• p391 The Multiconfigurational Carbon-Antimony Pair in Silicon   [ 174 K ]
  Authors: Brent W. Benson, E. Gurer, G.D. Watkins
• p397 Excitation Spectrum of the Interstitial Iron Donor in Silicon   [ 270 K ]
  Authors: J. Olajos, B. Bech Nielsen, Mats Kleverman, P. Omling, P. Emanuelsson, Hermann G. Grimmeiss