HOME CONTACT

Username: Password:

> @scientific.net

Defects in Semiconductors 16

Materials Science Forum Volumes 83 - 87

• Papers
• Abstracts

• p251 Magnetic Resonance from a Metastable Sulfur-Pair-Related Complex Defect in Silicon   [ 264 K ]
  Authors: W.M. Chen, M. Singh, Anne Henry, Erik Janzén, Bo Monemar, A.M. Frens, M.T. Bennebroek, J. Schmidt, K.J. Reeson, Russell Gwilliam
• p257 Piezospectroscopy of Two Beryllium Related Double Acceptors in Silicon   [ 357 K ]
  Authors: J.N. Heyman, A. Giesekus, Eugene E. Haller
• p263 On the Determination of Nitrogen in Czochralski Silicon   [ 252 K ]
  Authors: M.W. Qi, T.S. Shi, S.S. Tan, Bin Zhu, P. Cai, Long Quan Liu, Duan Lin Que, L.B. Li
• p269 β NMR of Nonsubstitutional ¹²B after Implantation into P-Type Silicon   [ 193 K ]
  Authors: Bernd Fischer, W. Seelinger, E. Diehl, K.-H. Ergezinger, H.-P. Frank, Bernd Ittermann, F. Mai, G. Welker, H. Ackermann, H.J. Stöckmann
• p273 Defect Impurity Complex Formation at High Donor Concentration in Silicon   [ 228 K ]
  Authors: Arne Nylandsted-Larsen, G. Weyer
• p279 Electronic Structure of Isolated Aluminium Point Defects and Defect Pairs in Silicon   [ 325 K ]
  Authors: Harald Overhof, Gàbor Corradi
• p285 Interaction and Dynamics of High-Temperature Defects in Carbon-Rich Silicon   [ 273 K ]
  Authors: N.B. Urli, B. Pivac
• p291 Photoluminescence of Edge-Defined Film-FED Growth Silicon   [ 383 K ]
  Authors: Tiago Martins, William D. Sawyer, Jürgen Michel
• p297 EPR Studies of NTD-Produced as Donors in Isotopically Enriched ⁷⁴Ge Single Crystals   [ 211 K ]
  Authors: V.S. Weiner
• p303 In Situ HVEM Study of Dopant Dependent Defect Generation in Silicon during 1 MeV Electron Irradiation   [ 562 K ]
  Authors: A. Romano-Rodríguez, Jan Vanhellemont