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European Powder Diffraction

Materials Science Forum Volumes 133 - 136

• Papers
• Abstracts

• p163 New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction   [ 202 K ]
  Authors: G. Bermig, J. Tobisch, K. Richter, Kurt Helming
• p169 Texture Analysis of Thin Films on Single Crystalline Substrates   [ 378 K ]
  Authors: H. Dittrich, G. Flik, H.U. Habermeier, Th. Köhler, B. Leibold, M. Schuster
• p175 X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers   [ 186 K ]
  Authors: I. Tomov
• p181 Texture Determination of PbZr_0.53Ti_0.47O₃ Thin Films by XRD and BKDP   [ 213 K ]
  Authors: K.Z. Troost, A.J. Kinneging
• p189 The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking   [ 187 K ]
  Authors: K. Shankland, C.J. Gilmore
• p195 Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis   [ 250 K ]
  Authors: L.A. Solovyov, S.D. Kirik
• p201 Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data   [ 124 K ]
  Authors: J.M. Amigó, L.E. Ochando, A. Charaї, R. Ballesteros, Jordi Rius
• p207 Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source   [ 235 K ]
  Authors: P. Lightfood, M.J. Tremayne, Kenneth D.M. Harris, C. Glidewell, K. Shankland, C.J. Gilmore, Peter G. Bruce
• p213 Application of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and Alloys   [ 259 K ]
  Authors: B.I. Nikolin
• p221 Diffraction from Thin Layers   [ 448 K ]
  Authors: P.F. Fewster, N.L. Andrew