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European Powder Diffraction

Materials Science Forum Volumes 133 - 136

• Papers
• Abstracts

• p231 Glancing-Incidence X-Ray Analysis of Thin Films   [ 157 K ]
  Authors: D.K.G. De Boer, W.W. van den Hoogenhof
• p237 Intermediate-Resolution Reciprocal-Space Mapper   [ 201 K ]
  Authors: P. Van der Sluis
• p243 Locally Resolved X-Ray Investigations by Means of X-Ray Optics   [ 242 K ]
  Authors: A. Krutzenbichler, J. Keimel, G. Fritsch
• p249 A New Apparatus for In-Situ X-Ray Diffraction   [ 209 K ]
  Authors: D.R. Bates, G.D. Squire, D.C. Puxley
• p255 In Situ Study of Particle Growth   [ 263 K ]
  Authors: L. Grabaek, B.S. Clausen, G. Steffensen, H. Topsoe
• p261 A High Pressure Study of Metallic Glasses using Energy-Dispersive Powder Diffraction   [ 203 K ]
  Authors: S.M. Clark, G. Oszlányi
• p267 X-Ray Diffractometry at High Temperatures   [ 104 K ]
  Authors: M. Ermrich
• p273 On the use of CPS120 Data in Rietveld Analysis   [ 195 K ]
  Authors: Kenny Ståhl
• p279 An Unconventional Pile-up Correction   [ 119 K ]
  Authors: J. Bergmann, L. Hollang, K. Richter
• p287 PC-Rietveld Plus, A Comprehensive Rietveld Analysis Package for PC   [ 243 K ]
  Authors: R.X. Fischer, C. Lengauer, E. Tillmanns, R.J. Ensink, Céleste A. Reiss, E.J. Fantner