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Textures of Materials - ICOTOM 10

Materials Science Forum Volumes 157 - 162

• Papers
• Abstracts

• p125 X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals   [ 155 K ]
  Authors: U. Czubayko, Dmitri A. Molodov, B.-C. Petersen, Günter Gottstein, Lasar S. Shvindlerman
• p131 A High-Pressure Device for In-Situ Measurements in a Neutron Beam   [ 273 K ]
  Authors: J. Heinitz, N.N. Isakov, A.N. Nikitin, W.A. Sukhoparov, K. Ullemeyer, Kurt Walther
• p137 Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality   [ 539 K ]
  Authors: Jarle Hjelen, A.H. Qvale, Ø. Gomo
• p143 A High Resolution Electron Diffraction Method for On-Line Texture Analysis   [ 441 K ]
  Authors: R. Høier, J. Bentdal, O. Daaland, Erik Nes
• p149 Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns   [ 685 K ]
  Authors: N.C. Krieger Lassen, Dorte Juul Jensen, K. Condradsen
• p159 Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements   [ 308 K ]
  Authors: B. Moreau, Francis Wagner, H. Göbel
• p167 Determination of Texture in CuZnAl Shape Memory Alloys in the High Temperature Austenitic Phase   [ 303 K ]
  Authors: No Jin Park, Hans Joachim Bunge
• p175 Orientation Connectivity in Polycrystals   [ 292 K ]
  Authors: Valerie Randle
• p181 High Temperature Texture Goniometer for the Measurement of Transformation Textures   [ 345 K ]
  Authors: F.R. Reher, W. Hänel, U. Czubayko, Günter Gottstein
• p187 A CCD Camera System for the Acquisition of Backscatter Kikuchi Patterns on an SEM   [ 163 K ]
  Authors: Robert A. Schwarzer