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European Powder Diffraction 3

Materials Science Forum Volumes 166 - 169

• Papers
• Abstracts

• p299 Preparation and Properties of W/Si Multilayer X-Ray Reflectors   [ 172 K ]
  Authors: Hans Joachim Kühn, J. Kräußlich, G. Natura
• p307 Investigation of the Behaviour of Stress in Metallization Thin Films for Microelectronics during Thermal Cycling using High-Temperature X-Ray Diffraction   [ 354 K ]
  Authors: G.M. Zorn, M. Schneegans
• p313 X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition   [ 219 K ]
  Authors: Harm Wulff, H. Steffen, V. Krasemann, J. Klimke
• p319 An X-Ray Study of Thermally-Sprayed Metal Coatings   [ 301 K ]
  Authors: I. Iordanova, K.S. Forcey, J. Valtcheva, B. Gergov
• p325 Characterization by XRPD of Diamond Films Grown on Titanium   [ 194 K ]
  Authors: G. Cappuccio, V. Sessa, M.L. Terranova, C. Veroli
• p331 Investigation of Thermal Aging of Ni/C-Multilayers by X-Ray Methods   [ 262 K ]
  Authors: R. Krawietz, B. Wehner, T. Sebald, H. Mai, Reiner Dietsch
• p337 Thickness and Density Determination for Ni-C-Ni Ultrathin Film by Photoemission and X-Ray Fluorescence Measurements under Total External Reflection   [ 258 K ]
  Authors: E. Burattini, G. Cappuccio, V. Sessa, I.Yu. Kharitonov, M.V. Kovalchuk, N.N. Novikova, A.N. Sosphenov, S.I. Zheludeva
• p343 Structural Analysis and Residual Stress Measurements in a Natural Titanium Oxide Layer   [ 212 K ]
  Authors: M. Härting, G. Fritsch
• p349 In Situ Determination of the Residual Stress Field Induced by Air Oxidation, up to 1000 ºC, in a 20% Cr 5% Al Ferritic Steel, by X-Ray Diffraction   [ 419 K ]
  Authors: Frédéric Bernard, E. Sciora, M. Lambertin, N. Gerard
• p355 In Situ Study of the Formation of Orientations during the High Temperature Oxidation of Copper   [ 176 K ]
  Authors: Vladislav Kolarik, Maria Juez-Lorenzo, N. Eisenreich, W. Engel