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Semiconductor Processing and Characterization with Lasers

Materials Science Forum Volumes 173 - 174

• Papers
• Abstracts

• p141 Laser Characterization of Semiconductors   [ 510 K ]
  Authors: M. Stutzmann
• p153 Silicon Surface Nonlinear Optics   [ 226 K ]
  Authors: C. Jordan, G. Marowsky, R. Buhleier, G. Lüpke, E.J. Canto-Said, Z. Gogolak, J. Kuhl
• p159 Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions   [ 435 K ]
  Authors: J. Carstensen, W. Lippik, H. Föll
• p165 Laser Examined AlGaAs-Solar Cells with Wide-Gap Tunneling-Thin Cap Layers   [ 210 K ]
  Authors: V.M. Andreev, V.P. Kvostikov, V.R. Larionov, V. Rumyantsev
• p171 Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures   [ 267 K ]
  Authors: J.M. Borrego
• p177 Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities   [ 263 K ]
  Authors: F. Becker, Reinhard Carius, J.-Th. Zettler, J. Klomfass, C. Walker, H. Wagner
• p183 Summary Abstract: Laser Surface Photovoltage Spectroscopy - A New Tool for Determination of Surface State Distributions and Properties   [ 312 K ]
  Authors: L. Kronik, L. Burstein, E. Fefer, M. Leibovitch, Y. Shapira
• p185 Photorefractive Two Wave Mixing and Steady State Photocarrier Gratings for Semiconductor Characterization   [ 5 M ]
  Authors: B. Smandek, Y. Ding, V. Hagemann, S. Gohlke, A. Wappelt, R. Wendt
• p191 A Novel Contactless Approach for Accurate Measurements of Electron-Hole Recombination Lifetime   [ 181 K ]
  Authors: G. Breglio, Antonello Cutolo, P. Spirito, L. Zeni
• p197 Raman Studies of Doped Poly-Si Thin Films Prepared by Pulsed Excimer Laser Annealing   [ 312 K ]
  Authors: A. Compaan, M.E. Savage, U. Jayamaha, T. Azfar, A. Aydinli