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Passivation of Metals and Semiconductors

Materials Science Forum Volumes 185 - 188

• Papers
• Abstracts

• p261 STM Images of Material Surfaces Deformed by Impingement of a Solid Ball and Characterizations of their Passive Films   [ 497 K ]
  Authors: Hiroshi Nanjo, N. Sanada, K. Koike
• p267 Structure of Galvanostatic Anodic TiO₂ Films: Comparison of Microscopies   [ 746 K ]
  Authors: J-.L. Delplancke, M.-P. Delplancke, R. Winand
• p275 Electrochemical and Surface Analytical Characterization of Hot Water Oxide Layers on Iron-Chromium Alloys   [ 835 K ]
  Authors: F. Schneider, M. Herrich, A. John, J. Engelmann, K. Mummert
• p285 Short-Range Order and Structure of Silicon Dioxide and Silicon Nitride Layers   [ 266 K ]
  Authors: E.A. Repnikova, V.A. Gurtov
• p293 Structure of Aluminium Oxide Films and its Changes due to Thermal and Electrochemical Processes   [ 304 K ]
  Authors: N.M. Yakovleva, A.N. Yakovlev
• p301 EXAFS Analysis of Passivating Films   [ 485 K ]
  Authors: H.-H. Strehblow, P. Borthen
• p313 Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS   [ 583 K ]
  Authors: D. Landolt, P. Schmutz, H.J. Mathieu
• p325 XPS Analysis of Passive Films Formed on Chromium in Acidic Solution without and with Chloride Ions   [ 507 K ]
  Authors: Daniel Costa, W.P. Yang, Philippe Marcus
• p337 Ageing of Passive Films on Stainless Steels in Sulfate Solutions - XPS Analysis   [ 491 K ]
  Authors: A. Rossi, B. Elsener
• p347 Dissolution and Passivation of Stainless Steels Eposed to Hydrochloric Acid   [ 553 K ]
  Authors: L. Wegrelius, I. Olefjord