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HomeMaterials Science ForumMaterials Science Forum Vols. 189-190Electron Microscope Investigations of Thin...

Electron Microscope Investigations of Thin Adhesive Layers on Adhesive/Metal Interfaces

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Interfaces II

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Periodical:

Materials Science Forum (Volumes 189-190)

Pages:

229-234

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.189-190.229

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Online since:

July 1995

Authors:

A.R. Wilson, L.T. Lambrianidis, D.R. Arnott, Andrew N. Rider, J. Shenton

Keywords:

Adhesive Bonding, Interface, Monte-Carlo, Scanning Electron Microscope (SEM), Silane, X-Ray Analysis

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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