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Advances in Crystal Growth

Materials Science Forum Volume 203

• Papers
• Abstracts

• p181 Computer Modeling of the First Order Phase Transition Kinetics   [ 218 K ]
  Authors: V. Sessa, M. Fanfoni, M. Tomellini
• p187 Modeling of Dislocation Formation during InP LEC Growth: A Comparison among the Thermoelastic and the Thermoplastic Approaches   [ 231 K ]
  Authors: S. Fogliani, Maurizio Masi, S. Carrà, G. Guadalupi, B. Molinas, L. Meregalli
• p193 Theoretical Equilibrium and Growth Morphologies of CaCO₃ Polymorphs: Aragonite and Cacite   [ 212 K ]
  Authors: D. Aquilano, M. Rubbo
• p197 Some Considerations on the Microgravity Effects upon the Interfacial Free Energy   [ 192 K ]
  Authors: R. Tognato
• p203 Detailed Modeling of Barrel Chemical Vapor Deposition Reactors   [ 301 K ]
  Authors: Maurizio Masi, S. Fogliani, S. Carrà
• p209 Modeling of the 2-D Particle Size Distribution Function in the Early Stage of Thin Film Growth   [ 196 K ]
  Authors: M. Tomellini
• p217 Static Disorder in Si_1-xGe_x Alloys and in Silicon on Insulator Structures   [ 224 K ]
  Authors: Marco Servidori, S. Milita, F. Cembali, G. Lulli
• p223 X-Ray Diffraction Study of Lattice Strain Relaxation in Mismatched III-V Heteroepitaxial Layers   [ 403 K ]
  Authors: P. Franzosi, L. Francesio, S. Gennari
• p231 Investigation of Interface Abruptness in Strained InAs/In_0.53Ga_0.47As Quantum Wells   [ 267 K ]
  Authors: M.R. Bruni, N. Gambacorti, Saulius Kaciulis, G. Mattogno, M.G. Simeone, S. Viticoli
• p237 Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements   [ 270 K ]
  Authors: G. Leo, T. Peluso, N. Lovergine, Anna Maria Mancini, L. Vasanelli, C. Giannini, L. Tapfer, F. Romanato, A.V. Drigo