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European Powder Diffraction 4

Materials Science Forum Volumes 228 - 231

• Papers
• Abstracts

• p423 A General Method for the Analysis of Non-Isothermal Kinetic Data   [ 227 K ]
  Authors: J.A. Kennedy, S.M. Clark
• p431 European Standardization of XRPD Measurements   [ 214 K ]
  Authors: Giovanni Berti
• p437 Powder Diffraction Simulation in the CAD of Multicomponenet Systems   [ 111 K ]
  Authors: V.P. Vorobjeva, V.I. Lutsyk
• p439 The Effect of Impurities on X-Ray Compton Scattering in Belite   [ 171 K ]
  Authors: R.P. Purlys, S.E. Stasiúnas, J.A. Yakimavichius
• p445 Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon   [ 401 K ]
  Authors: S. Geier, R. Hessmer, M. Schreck, B. Stritzker, B. Rauschenbach, Kurt Helming, Karsten Kunze, W. Erfurth
• p451 Residual Stress in Diamond Coatings by Synchrotron Radiation XRD   [ 329 K ]
  Authors: Paolo Scardi, Matteo Leoni, V. Sessa, M.L. Terranova, G. Cappuccio
• p457 Grain Size Analysis in Electrodeposited Cu-Coatings   [ 769 K ]
  Authors: S. Schläfer, P. Klimanek, I. Handreg, G. Heinzel, G. Lanza
• p463 On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings   [ 455 K ]
  Authors: I. Handreg, P. Klimanek, G. Lanza, M. Schneider
• p469 Variation of Preferred Orientation of Erbium Thin Films with Temperature and Substrate   [ 387 K ]
  Authors: G.R.G. Craib, M.A. Player, M.J. Rodman, C.C. Tang
• p475 Microstructure Formation in Electrodeposition of Highly Supersaturated Cu-Pb and Ag-Pb Layers   [ 300 K ]
  Authors: Th. Barthel, P. Klimanek, Ch.J. Raub, A. Zielonka