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Materials Science Applications of Ion Beam Techniques

Materials Science Forum Volumes 248 - 249

• Papers
• Abstracts

• p73 Ion Beam Induced Epitaxial Crystallization of Buried SiC Layers in Silicon   [ 471 K ]
  Authors: J.K.N. Lindner, K. Volz, B. Stritzker
• p79 Ion Beam Induced Epitaxial Regrowth and Interfacial Amorphization of Compound Semiconductors   [ 447 K ]
  Authors: E. Glaser, T. Fehlhaber, Robert Schulz, T. Bachmann
• p87 Effects of Ion Irradiation on Ferromagnetic Thin Films   [ 306 K ]
  Authors: J.E.E. Baglin, M.H. Tabacniks, R. Fontana, A.J. Kellock, T.T. Bardin
• p95 Special Surface Structures in Surface Alloy Growth   [ 294 K ]
  Authors: D.J. O'Connor, J. Yao, Yao Gen Shen
• p101 Charge Carrier Lifetime Modificaiton in Silicon by High Energy H⁺, He⁺ Ion Implantation   [ 260 K ]
  Authors: N.Q. Khánh, P. Tüttö, E.N. Jároli, O. Buiu, L.P. Biró, F. Pászti, T. Mohácsy, C. Kovacsics, A. Manuaba, J. Gyulai
• p107 Range Parameters of Aluminium Implanted Targets   [ 308 K ]
  Authors: M. Hayes, E. Friedland, T. Hauser
• p113 Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers   [ 347 K ]
  Authors: N. Achtziger
• p119 Hall Effect Measurements on Transmutation Doped Semiconductors   [ 294 K ]
  Authors: G. Rohrlack, Kristian Freitag, Ch. von Nathusius, R. Vianden, Russell Gwilliam, Brian J. Sealy
• p125 Characterization of Cu/Al₂O₃ Interfaces after Heavy Ion Irradiation   [ 317 K ]
  Authors: K. Neubeck, M. Rodewald, R. Riemenschneider, D.M. Rück, H. Baumann, Horst Hahn, Adam G. Balogh
• p129 In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope   [ 342 K ]
  Authors: L.P. Biró, J. Gyulai, K. Havancsák