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Materials Science Applications of Ion Beam Techniques

Materials Science Forum Volumes 248 - 249

• Papers
• Abstracts

• p339 Transition-Metal Silicide Layer Formation, the Phases of Mixed Silicides   [ 302 K ]
  Authors: I. Dézsi, Cs. Fetzer, I.S. Szűcs, J. Dekoster, G. Langouche
• p345 Composition and Structure of Codeposited Layers on Plasma Facing Components in Controlled Fusion Devices: Ion Beam and Microscopy Studies   [ 346 K ]
  Authors: M. Rubel, P. Wienhold
• p351 Ion-Beam Analysis of Solar-Cell Materials   [ 312 K ]
  Authors: H. Metzner
• p357 Evaluation of Coatings Produced by Low-Energy Ion Assisted Deposition of Co on Silicon   [ 228 K ]
  Authors: I.S. Tashlykov, G. Carter, J.S. Colligon
• p361 Application of the Combined Channeling Method at Higher Ion Energies on Cyclotron   [ 185 K ]
  Authors: F. Ditrói, J.D. Meyer, R.W. Michelmann, Klaus Bethge
• p365 Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry   [ 220 K ]
  Authors: E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V.N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D.L. Nagy, V.G. Semenov
• p369 Hydrogen Elastic Recoil Detection Depth Resolution and Sensitivity as a Function of Sample Composition   [ 225 K ]
  Authors: L.S. Wielunski, G.L. Harding, A. Bendavid
• p373 Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry   [ 244 K ]
  Authors: E. Szilágyi, Z. Hajnal, F. Pászti, O. Buiu, G. Craciun, C. Cobianu, C. Savaniu, É. Vázsonyi
• p377 Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si_1-xGe_x Single Crystals   [ 256 K ]
  Authors: A. Gerhardt, J. Donecker, B. Selle, Jürgen Wollweber
• p381 Hydrogen and Nitrogen Loss during ERD Analysis of Siliicon (Oxy)nitrides   [ 187 K ]
  Authors: S.G. Wallace, A.C. Kockelkoren, M.G. Boudreau, Peter Mascher, J.S. Forster, J.A. Davies