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Materials Science Applications of Ion Beam Techniques

Materials Science Forum Volumes 248 - 249

• Papers
• Abstracts

• p385 Composition and Structural Evolution of Al-Me Alloys (Me = Fe, Cu, Sb) Prepared by Means of Ultrarapid Quenching from the Melt Studied by RBS Technique   [ 161 K ]
  Authors: V. Shepelevich, I. Tashlykova-Bushkevich
• p389 Diffusion of Water into Quartz and Silica Glass   [ 242 K ]
  Authors: O. Dersch, A. Zouine, F. Rauch, Eisuke Arai
• p395 Lattice Location of Hf in Near-Stoichiometric LiNbO₃: RBS/Channeling and PAC Studies   [ 213 K ]
  Authors: J.G. Marques, A. Kling, L. Rebouta, M.F. da Silva, A.A. Melo, J.C. Soares, M.D. Serrano, E. Diéguez, F. Agulló-López
• p399 (1 - 3) MeV / amu Heavy Ion Irradiaiton Effects on Optical Properties of Al₂O₃   [ 224 K ]
  Authors: V.A. Skuratov, S.M. Abu-Al Azm, V.A. Altynov
• p405 Ion Beam Analysis and Applications in On-Line Monitoring of Ion Induced Modifications of Materials   [ 241 K ]
  Authors: D.K. Avasthi
• p409 Thin-Film Morphology and Rutherford Backscattering Spectrometry   [ 223 K ]
  Authors: Th. Hahn, H. Metzner, M. Gossla, J. Conrad
• p413 Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au⁶⁹⁺   [ 246 K ]
  Authors: T. Schenkel, M.A. Briere, H. Schmidt-Böcking, Klaus Bethge, D. Schneider
• p419 Ion Channeling Study of GaN Single Crystals   [ 225 K ]
  Authors: A. Turos, Lubomir J. Nowicki, A. Stonert, M. Leszczyński, I. Grzegory, Sylwester Porowski
• p427 Highly Focused Ion Beams in Integrated Circuit Testing   [ 499 K ]
  Authors: K.M. Horn, P.E. Dodd, B.L. Doyle
• p433 Atomic Structure and Electrical Properties of a Supertip Gas Field-Ion Source   [ 301 K ]
  Authors: Th. Miller, A. Knoblauch, S. Kalbitzer