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Defects in Semiconductors 19

Materials Science Forum Volumes 258 - 263

• Papers
• Abstracts

• p443 Recombination-Enhanced Fe Atom Jump of Fe-Acceptor Pairs in Si   [ 262 K ]
  Authors: Tohru Takahashi, Masashi Suezawa
• p449 Precipitation of Iron in FZ and CZ Silicon   [ 315 K ]
  Authors: H. Hieslmair, Andrei A. Istratov, Scott A. McHugo, C. Flink, Eicke R. Weber
• p455 The Orthorhombic FeIn Complex in Silicon   [ 335 K ]
  Authors: Per Tidlund, Mats Kleverman
• p461 Copper in Silicon: Quantitative Analysis of Internal and Proximity Gettering   [ 377 K ]
  Authors: Scott A. McHugo, T. Heiser, H. Hieslmair, C. Flink, Eicke R. Weber, S.M. Myers, G.A. Petersen
• p467 A Study of the Copper-Pair Related Centers in Silicon   [ 386 K ]
  Authors: Andrei A. Istratov, T. Heiser, H. Hieslmair, C. Flink, Joachim Krüger, Eicke R. Weber
• p473 The Photoluminescence of Pt-Implanted Silicon   [ 259 K ]
  Authors: Eduardo Alves, J. Bollmann, Manfred Deicher, M. Celeste Carmo, M.O. Henry, M.H.A. Knopf, Joaquim P. Leitão, R. Magerle, C.J. McDonagh
• p479 Identification of the Si:Au and Si:Pt 1S_3/2(Г₈)+Г Phonon-Assisted Fano Resonance   [ 286 K ]
  Authors: Mats Kleverman, J. Olajos, P. Tidlund
• p485 Silver-Related Donor Defect in Silicon   [ 259 K ]
  Authors: Meng-Xia Zhu, Gordon Davies, M. Zafar Iqbal, Edward C. Lightowlers
• p491 Isolated Substitutional Silver and Silver-Induced Defects in Silicon: An Electron Paramagnetic Resonance Investigation   [ 366 K ]
  Authors: P.N. Hai, T. Gregorkiewicz, C.A.J. Ammerlaan, D.T. Don
• p497 Pseudo or Deep Donor Excitation Spectra in Silicon   [ 312 K ]
  Authors: Mats Kleverman