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European Powder Diffraction 6

Materials Science Forum Volumes 321 - 324

• Papers
• Abstracts

• p386 In-Situ X-Ray Diffraction of Catalysts. Phase Transformation of Cu/Cr-Oxides with Different Initial Structure under Redox Conditions   [ 412 K ]
  Authors: T.A. Krieger, L.M. Plyasova, T.M. Yur'eva
• p392 Temperature and Time Resolved Studies of the Titanium Silicide Formatin with GIXRD abd GIXR   [ 368 K ]
  Authors: L. Fischer, J. Klimke, Harm Wulff
• p400 Texture and Secondary Extinction of Vacuum Deposited Ag Films   [ 289 K ]
  Authors: I. Tomov, M. Adamik, P.B. Barna
• p406 Characterization of Plasma Treated Al-Films by GIXR and GIXRD   [ 384 K ]
  Authors: Antje Quade, Harm Wulff
• p411 Texture Organisation in Deposited Cu - Layers   [ 385 K ]
  Authors: J.T. Bonarski, E. Bełtowska, Zbigniew Świątek
• p417 Application of the Monte Carlo Method to Fiber Texture of Electrolytically Deposited Ni Films   [ 215 K ]
  Authors: T. Fuller, K. Krezhov, I. Tomov, P. Konstantinov
• p422 Structure and Composition of Aluminised Layers and RF-Sputtered Alumina Coatings on High Chromium Martensitic Steel   [ 376 K ]
  Authors: I. Iordanova, K.S. Forcey, M. Surtchev
• p428 Analysis of the State of Stress in Precipitating Alloy Films. Precipitation of Ti in Mo-Ti Films   [ 404 K ]
  Authors: L. Velterop, R.D. Xia, Rob Delhez, Eric J. Mittemeijer
• p434 GIXR and GIXRD Investigations of ITO Films during Post-Deposition Annealing   [ 397 K ]
  Authors: M. Quaas, H. Steffen, Harm Wulff
• p439 Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films   [ 327 K ]
  Authors: Matteo Leoni, Yu Hui Dong, Paolo Scardi