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Microstructure of Polycrystalline Natural Samples from the Peak Profile Analysis of Diffraction Data
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HomeMaterials Science ForumMaterials Science Forum Vols. 347-349Advanced Fundamental Parameters Model for Improved...

Advanced Fundamental Parameters Model for Improved Profile Analysis

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Residual Stress ECRS 5

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Periodical:

Materials Science Forum (Volumes 347-349)

Pages:

303-308

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.347-349.303

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Online since:

May 2000

Authors:

J. Bergmann, R. Kleeberg, A. Haase, Bernd Breidenstein

Keywords:

Micro Strain, Rietveld, Size Analysis, Standard Free, Strain Analysis, X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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