Positron Annihilation - ICPA-12
Materials Science Forum Volumes 363 - 365
doi:10.4028/0-87849-875-3
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p457
A Study of Organo-Metallic Interfaces Using DBAR
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141 K
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Authors: C.E. Tucker, F.A. Smith, Paul G. Coleman
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p460
Pulsed Positron Beam Study of As-Grown Defects in Epitaxial SiC
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161 K
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Authors: D.T. Britton, D. Gxawu, A. Hempel, Marie France Barthe, L. Henry, P. Desgardin, C. Corbel, W. Bauer-Kugelmann, Peter Sperr, Gottfried Kögel, Werner Triftshäuser
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p463
Annealing Effects in Hydrogenated Amorphous Silicon Layers
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159 K
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Authors: A. Hempel, A. Dabrowski, M. Härting, M. Hempel, D. Knoesen, W. Bauer-Kugelmann, Gottfried Kögel, Werner Triftshäuser, D.T. Britton
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p466
Surfaces of SiO2-Bi2O3 Glasses Studied by a Slow Positron Beam
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175 K
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Authors: Grzegorz P. Karwasz, W. Deng, Roberto S. Brusa, Antonio Zecca, M. Gazda, B. Kusz, K. Trzebiatowski, D. Pliszka
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p469
Defect Study on Si Implanted with B and BF2 Ions by Coincidence Doppler Broadening Measurements
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157 K
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Authors: Takashi Akahane, Masanori Fujinami, Keisuke Ohnishi, Tsuguo Sawada
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p472
Positron Annihilation in Si and Si-Related Materials in Thermal Equilibrium at High Temperature
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176 K
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Authors: Akira Uedono, M. Watanabe, T. Ichihashi, S. Takasu, M. Muramatsu, T. Ubukata, Hiroshi Tanino, Shoichiro Tanigawa, T. Shiraishi
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p475
Defect Property in He+ Implanted Silicon Probed by Slow Positron Beam
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156 K
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Authors: X.Y. Zhou, T.H. Zhang, X.F. Zhang, Hui Min Weng, Y.M. Fan, J.F. Du, Rong Dian Han
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p478
GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
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182 K
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Authors: Y.F. Hu, Y.Y. Shan, C.D. Beling, S. Fung, M.H. Xie, S.H. Cheung, J. Tu, Gerhard Brauer, W. Anwand, D.S.Y. Tong
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p481
Determination of Structural Vacancy Densities in Icosahedral Quasicrystals by Slow Positron Beam Technique
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162 K
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Authors: K. Sato, H. Uchiyama, Y. Takahashi, Ikuzo Kanazawa, R. Tamura, Kaoru Kimura, F. Komori, Ryoichi Suzuki, Toshiyuki Ohdaira, S. Takeuchi
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p484
Depth-Dependence Recovery of Helium-Implanted 18 Carats Gold-Silver Alloy
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193 K
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Authors: Gerhard Brauer, T. Thomé, J. Fradin, R.I. Grynszpan, W. Anwand