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European Powder Diffraction EPDIC 7

Materials Science Forum Volumes 378 - 381

• Papers
• Abstracts

• p132 Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting   [ 490 K ]
  Authors: Paolo Scardi, Yu Hui Dong, Matteo Leoni
• p142 Calculation of Diffraction Line Profiles for Structures with Dislocations   [ 347 K ]
  Authors: Jan-Dirk Kamminga, Rob Delhez
• p148 Peak-Shape Analysis Using the General Debye Equation   [ 297 K ]
  Authors: Yuri G. Andreev, Peter G. Bruce
• p154 Peculiarities of the X-Ray Powder Diffraction Patterns from FCC Crystals Containing a High Concentration of Random Deformation Stacking Faults   [ 304 K ]
  Authors: A.I. Ustinov, N.M. Storchak, L.O. Olikhovska
• p160 Structural Characteristics of Disordered Lamellar Structures: Interpretation of XRD and SAXS Patterns   [ 263 K ]
  Authors: H. Ben Rhaiem, A. Ben Haj Amara, C.H. Pons
• p166 Peak Shift Correction for Transparency in Classical XRD Residual Stress Methods   [ 298 K ]
  Authors: Arnold C. Vermeulen
• p174 General Newly-Discovered Regularities of Structure Inhomogeneity in Textured Metal Materials   [ 377 K ]
  Authors: Yuriy Perlovich, Margarita Isaenkova, Hans Joachim Bunge
• p180 The Fullest Description of the Structure of Textured Metal Materials with Generalized Pole Figures: the Example of Rolled Zr Alloys   [ 350 K ]
  Authors: Yuriy Perlovich, Margarita Isaenkova, Hans Joachim Bunge
• p186 Modeling the Texture Development of Two-Phase Composites by Considering Intra-Crystalline Misorientation   [ 391 K ]
  Authors: R. Bolmaro, Heinz Günter Brokmeier, A. Roatta, A.L. Fourty, M.A. Bertinetti, J.W. Signorelli
• p192 Anisotropy of Secondary Extinction Coefficient in Textured Films   [ 334 K ]
  Authors: I. Tomov