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Residual Stresses VI, ECRS6

Materials Science Forum Volumes 404 - 407

• Papers
• Abstracts

• p1 Residual Strain Measurement by Synchrotron Diffraction   [ 653 K ]
  Authors: Philip J. Withers, Michael Preuss, P.J. Webster, D.J. Hughes, Alexander M. Korsunsky
• p13 Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry   [ 298 K ]
  Authors: Carsten Stock, Christoph Genzel, Walter Reimers
• p19 Global X-Ray Method for the Determination of Stress Profiles   [ 243 K ]
  Authors: Jean Michel Sprauel, H. Michaud
• p25 The Influence of Surface Roughness on the Refraction Correction of Bragg Peak Positions   [ 206 K ]
  Authors: Michael Ott, Detlef Löhe
• p29 Application of Non-linear Sin²ψ Method for Stress Determination Using X-Ray Diffraction   [ 290 K ]
  Authors: A. Baczmański, R.J. Lark, S.J. Skrzypek
• p35 Assumptions in Thin Film Residual Stress Methods   [ 308 K ]
  Authors: Arnold C. Vermeulen
• p43 Residual Stresses Near Holes in Tempered Glass Plates   [ 326 K ]
  Authors: Laurent Daudeville, Frédéric Bernard, René Gy
• p49 Residual Stresses in Bulk Metallic Glasses – I: Modeling   [ 277 K ]
  Authors: Cahit Can Aydiner, Ersan Üstündag
• p55 Modelling of the Relaxation Behaviour of Carbide-Hardened Superalloys   [ 279 K ]
  Authors: U. Martin, H. Oettel, U. Mühle
• p61 Characterization of Machining Distortion by Strain Energy Density and Stress Range   [ 243 K ]
  Authors: R.W. Schultz, M.E. Karabin