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Residual Stresses VI, ECRS6

Materials Science Forum Volumes 404 - 407

• Papers
• Abstracts

• p653 Measurement of Residual Stress Through a Shot Peened Surface Subjected to Successive Material Removal   [ 281 K ]
  Authors: N.W. Bonner, Robert C. Wimpory, G.A. Webster, A. Tony Fry, F.A. Kandil
• p659 Round Robin Test on the Determination of Residual Stress Depth Distributions by X-ray Diffraction   [ 367 K ]
  Authors: Jens Gibmeier, Jian Lu, Berthold Scholtes
• p665 Behavior of Metallic Samples Subjected to External Stresses during Heating-Cooling Cycles   [ 249 K ]
  Authors: S. Battaglia, F. Mango
• p671 Yield Strength Determination of TiN Film by In-Situ XRD Stress Analysis Method   [ 262 K ]
  Authors: M. Qin, Vincent Ji, Jiu Hua Xu, J.B. Li, Ke Wei Xu, S.L. Ma
• p677 X-Ray Stress Measurements of TiCN Thin Films   [ 215 K ]
  Authors: Masahide Gotoh, Takayuki Murotani, Toshihiko Sasaki, Yukio Hirose
• p683 Residual Stresses in Decorative Electroplated Coatings   [ 340 K ]
  Authors: J.C.P. Pina, A. Morão Dias, Jean Lu Lebrun
• p691 Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects   [ 298 K ]
  Authors: B. Okolo, P. Lamparter, U. Welzel, T. Wagner, Eric J. Mittemeijer
• p697 Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction   [ 289 K ]
  Authors: Jozef Keckes
• p703 X-Ray Measurements of TiN Film and Steel Substrate Subjected to External Loading   [ 367 K ]
  Authors: Keisuke Tanaka, Toshimasa Ito, Yoshiaki Akiniwa, Takahiro Ishii, Yasuhiro Miki
• p709 Macro Stress Mapping on Thin Film Buckling   [ 287 K ]
  Authors: Philippe Goudeau, Pascale Villain, Pierre Olivier Renault, Nobumichi Tamura, R.S. Celestre, H.A. Padmore