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EBSD Analysis of Grain Boundary Characteristics of Abnormally Grain Grown Alumina

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Periodical:

Materials Science Forum (Volumes 408-412)

Pages:

1699-1704

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.408-412.1699

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Online since:

August 2002

Authors:

Dong Ik Kim, Je Hun Lee, Young Wook Kim, Kyu Hwan Oh, Hu Chul Lee

Keywords:

AGG Alumina, Electron Backscatter Diffraction (EBSD), Minimum Misorientation, Montage, Random

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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