Materials Science & Technology

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CONFERENCE
9/7/2009 - 9/10/2009
6/28/2009 - 7/3/2009

Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

doi:10.4028/0-87849-920-2.247
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