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European Powder Diffraction EPDIC 8

Materials Science Forum Volumes 443 - 444

• Papers
• Abstracts

• p107 Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths   [ 155 K ]
  Authors: Marek Andrzej Kojdecki
• p111 Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave   [ 175 K ]
  Authors: Radomír Kužel, D. Šimek, J. Kub, Rinat K. Islamgaliev
• p115 Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction   [ 167 K ]
  Authors: J. Lhotka, Radomír Kužel, G. Cappuccio, V. Valvoda
• p119 XRD Line Broadening Analysis with Ball Milled Palladium   [ 175 K ]
  Authors: I. Lucks, P. Lamparter, Jian Xu, Eric J. Mittemeijer
• p123 Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties   [ 208 K ]
  Authors: Juan Rodríquez-Carvajal, T. Roisnel
• p127 Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions   [ 171 K ]
  Authors: Arnold C. Vermeulen, Rob Delhez
• p131 Applicability of the Crystallite Group Method to Fibre Textured Specimens   [ 155 K ]
  Authors: U. Welzel, Eric J. Mittemeijer
• p137 Optimization of X-Ray Pole Figure Measurement   [ 624 K ]
  Authors: L. Tarkowski, L. Laskosz, Jan T. Bonarski
• p141 Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films   [ 168 K ]
  Authors: I. Tomov
• p145 A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films   [ 177 K ]
  Authors: H. Toraya, H. Hibino, Takashi Ida