European Powder Diffraction EPDIC 8
Materials Science Forum Volumes 443 - 444
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p151
Investigating X-Ray Bragg-Line Displacement as a Technique for Determination of the Thermal Expansion Coefficient of Solid Samples
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182 K
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Authors: S. Battaglia, F. Mango -
p155
Small Angle X-Ray Scattering with Cobalt Radiation for Nanostructure Characterization of Fe-Based Specimen
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323 K
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Authors: Kurt Erlacher, R. Görgl, Jozef Keckes, Hannes F. Jakob, L. Bruegemann, P. Doppler, A. Bergmann, Heinz Leitner, S. Marsoner, Peter Fratzl -
p159
Performance Stability of Microfocusing Source and Multilayer Optics Based X-Ray Diffraction System
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119 K
]
Authors: Bonglea Kim, Boris Verman, Licai Jiang -
p163
Fitting of Reciprocal Space Maps of Thin Films with Texture and Stress
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2 M
]
Authors: D. Šimek, Radomír Kužel, J. Kub, F. Kunc -
p167
Analytical Comparison of Parallel Beam and Bragg-Brentano Diffractometer Performances
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129 K
]
Authors: Boris Verman, Bonglea Kim -
p171
A Simple Analytical Approach to Describe a Beam Conditioning System
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132 K
]
Authors: Boris Verman, Srivatsan Seshadri, Bonglea Kim -
p175
128-Channel Silicon Strip Detector Installed at a Powder Diffractometer
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636 K
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Authors: A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek -
p181
Future Trends in High Intensity Neutron Powder Diffraction
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1 M
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Authors: T. Hansen -
p189
Texture Inheritance in a Zn Protective Layer
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587 K
]
Authors: Jan Bonarski -
p193
Effect of Annealing on Structural Properties of Co Thin Films and Co/Cu Multilayers
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282 K
]
Authors: M. Hecker, N. Mattern, W. Brückner, C.M. Schneider
