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Vacancy Formation in GaAs under Different Equilibrium Conditions

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

54-56

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.54

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Online since:

January 2004

Authors:

V. Bondarenko, J. Gebauer, F. Redmann, Reinhard Krause-Rehberg

Keywords:

Annealing, Arsenic Vacancy, GaAs, Gallium Vacancy

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] D.T.J. Hurle: J. Appl. Phys. 85 (1999), p.6957.

Google Scholar

[2] R.M. Cohen: Mater. Sci. Eng. 20 (1997), p.167.

Google Scholar

[3] N.A. Gokcen: Bulletion of Alloy Phase Diagrams. 10 (1989), p.11.

Google Scholar

[4] J. Gebauer, R. Krause-Rehberg, C. Domke, P. Ebert, and K. Urban: Phys. Rev. Lett. 78 (1997), p.3334.

DOI: 10.1103/physrevlett.79.958

Google Scholar

[5] C. Domke, P. Ebert, M. Heinrich, and K. Urban: Phys. Rev. B. 54 (1996), p.10288.

Google Scholar

[6] J. Gebauer, M. Lausmann, T.E.M. Staab, R. Krause-Rehberg, H. Hakala, and M.J. Puska: Phys. Rev. B. 60 (1999), p.1464.

DOI: 10.1103/physrevb.60.1464

Google Scholar

[7] R. Krause-Rehberg and H.S. Leipner: Appl. Phys. A. 64 (1997), p.457.

Google Scholar

[8] G.A. Baraff and M. Schlüter: Phys. Rev. Lett. 55 (1985), p.2340.

Google Scholar

[9] H. Xu: J. Appl. Phys. 68 (1990), p.4077.

Google Scholar

[10] K. Saarinen, P. Hautojärvi, P. Lanki, and C. Corbel: Phys. Rev. B. 44 (1991), p.10585.

Google Scholar

[11] R. Ambigapathy, A.A. Manuel, P. Hautojärvi, K. Saarinen, and C. Corbel: Phys. Rev. B. 50 (1994), p.2188.

Google Scholar

[12] S. Kuisma, K. Saarinen, P. Hautojärvi, C. Corbel, and C. LeBerre: Phys. Rev. B. 53 (1996), p.9814.

DOI: 10.1103/physrevb.53.9814

Google Scholar

[13] J.P. Peng, K.G. Lynn, M.T. Umlor, D.J. Keeble, and D.R. Harshman: Phys. Rev. B. 50 (1994), p.11247.

Google Scholar

[14] C.C. Tin, C.K. Teh, and C.K. Weichman: J. Appl. Phys. 62 (6) (1987), p.2329.

Google Scholar

[15] K. Kuriyama, K. Tomizawa, S. Uematsu, and H. Takahashi: Appl. Phys. Lett. 65 (6) (1994), p.746.

Google Scholar