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Progress in Advanced Materials and Processes

Materials Science Forum Volumes 453 - 454

• Papers
• Abstracts

• p1 Towards SiGe Terahertz VCSELs   [ 559 K ]
  Authors: R.W. Kelsall, Z. Ikonić, P. Harrison, D.J. Paul, S.A. Lynch, R. Bates, D.J. Norris, S.L. Liew, A.G. Cullis, D.D. Arnone, C.R. Pidgeon, P. Murzyn, D.J. Robbins, R.A. Soref
• p9 Comparison of Direct Numerical Procedure and Monte Carlo Technique to Determine the Charging Effects in Submicron Structures   [ 644 K ]
  Authors: Z.Lj. Petrović, S. Sakadžić, N. Spasojević, J. Matsui, T. Makabe
• p15 Data Bases for Modeling Plasma Devices for Processing of Integrated Circuits   [ 218 K ]
  Authors: Željka Nikitović, O. Šašić, Z.Lj. Petrović, G.N. Malović, A. Strinić, S. Dujko, Z. Raspopović, M. Radmilović-Radjenović
• p21 Optimization of Intersubband Optical Nonlinearities in Continually Graded AlGaN Quantum Well Structures   [ 258 K ]
  Authors: J. Radovanović, V. Milanović, Z. Ikonić, D. Indjin
• p27 Surface Density Analytical Model of Two-Dimensional Electron Gas in HEMT Structures   [ 217 K ]
  Authors: R.M. Ramović, P.M. Lukić
• p33 Thermodynamics of Mechanical Oscillations in Superlattices   [ 221 K ]
  Authors: S.K. Jaćimovski, J.P. Šetrajčić, B.S. Tošić, V.D. Sajfert
• p37 Study of the Increased Temperature Influence on the Degradation of the Photodetectors through Ideality Factor   [ 190 K ]
  Authors: A. Vasić, P. Osmokrović, S. Stanković, B. Lončar
• p43 Metal-Induced Crystallization of Polycrystalline Silicon by In-Situ Excimer Laser Annealing During Low-Pressure CVD Growth   [ 2 M ]
  Authors: S. Loreti, A. Santoni, Rudolf Fryček, I. Menicucci, C. Minarini, D. Della Sala
• p47 Applications of ZrO₂ - CeO₂ - La₂O₃ Films in Multilayered Oxide Heterostructures   [ 372 K ]
  Authors: A.N. Khodan, J.-P. Contour, D. Michel
• p55 The Effect of Various Parameters on the Structure of W-Ti Thin Films   [ 787 K ]
  Authors: S. Petrović, B. Gaković, Z. Rakočević, T. Nenadović