[1]
K. Nakamura and Y. Kawamura, IEEE Trans. Ultrason. Ferroelect. Freq. Contr., 47 (2000), p.750.
Google Scholar
[2]
U. Fluckinger, H. Arend and H. R. Oswald, J. Am. Ceram. Soc., 56 (1977), p.575.
Google Scholar
[3]
K. Toda, N. Sakai, H. Ohnuma, Y. Aoyama, S. Tokuoka, M. Sato, Ext. Abstr. (The 25th Symposium on Solid State Ionics in Japan 1999); The Solid State Ionics Society of Japan, 2A9.
Google Scholar
[4]
K. Toda, S. Tokuoka, K. Uematsu and M. Sato, Key Eng. Mater., 214-215 (2002), p.67.
Google Scholar
[5]
K. Toda, N. Ohtake,M. Kawakami, S. Tokuoka, K. Uematsu and M. Sato, Jpn. J. Appl. Phys., 41 (2002), p.7021.
Google Scholar
[6]
K. Nishi, K. Shimizu, M. Takamatsu, H. Yoshida, A. Satsuma, T. Tanaka, S. Yoshida and T. Hattori, J. Phys. Chem. B, 102 (1998), p.10190.
DOI: 10.1021/jp982704p
Google Scholar
[7]
R. E. Schaak and T. E. Mallouk, Chem. Mater., 12 (2000), p.3427.
Google Scholar
[8]
S. Yoshida, T. Tanaka, H. Yoshida, T. Hanada, T. Hiraiwa, H. Kanai and T. Funabiki, Catal. Lett., 12 (1992).
Google Scholar