Advances in Nondestructive Evaluation
Key Engineering Materials Volumes 270 - 273
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p192
3D X-Ray Laminography with CMOS Image Sensor Using a Projection Method for Reconstruction of Arbitrary Cross-Sectional Images
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363 K
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Authors: Yong Ki Chi, Seong Kyu Ahn, Kwang Hyun Kim, Gyu Seong Cho -
p198
3-Dimensional Imaging Technique for Shape Estimation of Flaw in Ultrasonic Non-Destructive Evaluation
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1 M
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Authors: Young Seock Lee, Chi Seong Park, Seon Jin Kim -
p204
Multiple Transmit Focusing Using Modified Orthogonal Golay Codes for Ultrasound Nondestructive Testing
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637 K
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Authors: Bae Hyung Kim, Tai Kyong Song -
p209
Signal Analysis for the Condition Monitoring of a Check Valve Using a Time-Frequency Representation
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349 K
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Authors: C.K. Lee, Dai Bum Cha, Jung Taek Kim, Joo Sun Kim, Sang J. Lee, J. Yoo, J.H. Lee -
p215
Multiplierless Sigma-Delta Modulation Beam Forming for Ultrasound Nondestructive Testing
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602 K
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Authors: Ho San Han, Tai Kyong Song -
p221
A Systolic Multi-Layer and Multi-Line Stereo Vision System for 3D Visual Inspection
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350 K
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Authors: Hong Jeong, Sung Chan Park, Jung-Gu Kim -
p227
Transform Coding of Arbitrarily Shaped Regions in Ultrasonic Data
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99 K
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Authors: Ji-Hong Kim, Hee Jung Kim, Jung-Gu Kim, Doo Hyun Choi, Im Geun Lee, Kyo Hong Jin, Ki Ryong Kwon -
p233
Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding
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384 K
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Authors: Jong Hwan Oh, Dong Min Kwak, Kyu Bong Lee, Young Chul Song, Doo Hyun Choi, Kil Houm Park -
p239
Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors
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3 M
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Authors: Tae Hoon Lee, Jang Ho Ha, Sang Yoon Lee, Won Il Ko, Dae Yong Song, Ho Dong Kim -
p245
Development and Characterization of a Flat-Panel Detector-Based Microtomography System
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798 K
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Authors: Sang Chul Lee, Hok Yung Kim, In Kon Chun, Myung Hye Cho, Min Hyoung Cho, Soo Yeol Lee
