[1]
Juul Jensen, D., Poulsen, H.F., Recrystallization in 3d, in: N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, J.A. Wert, Proc. 21st Riso Int. Symp. Mat. Sci, Risø National Laboratory, Roskilde pp.103-124, (2000).
Google Scholar
[2]
Wroblewski, T., Geier, S., Hessmer, R., Schreck, M., Rauschenbach, B., X-ray imaging of polycrystalline materials, Rev. Sci. Instrum. Vol. 66, pp.3560-3562 , (1995).
DOI: 10.1063/1.1145469
Google Scholar
[3]
Wroblewski, T., Clauß, O., Crostack, H. -A., Ertel, A., Fandrich, F., Genzel, Ch., Hradil, K., Ternes, W., Woldt, E., A new diffractometer for materials science and imaging at HASYLAB beamline G3, Nucl. Instrum. Meth. A Vol. 428, pp.570-582, (1999).
DOI: 10.1016/s0168-9002(99)00144-8
Google Scholar
[4]
Wroblewski, T., and Woldt, E., Non-ambient micro diffraction, Adv. X-ray Anal. Vol. 42-30 CDROM.
Google Scholar
[5]
Humphreys, F.J., Hatherly, M., Recrystallization and Related Annealing Phenomena, Pergamon, Oxford, (1996).
Google Scholar
[6]
Wroblewski, T., Self-organized criticality - a model for recrystallization ?, Z. Metallkd., Vol. 93, pp.1228-1232, (2002).
DOI: 10.3139/146.021228
Google Scholar
[7]
Juul Jensen, D., Lauridsen, E.M., Vandermeer, R.A., In-situ determination of grain boundary migration during recrystallization", in: Ankem, S., Pande, C.S., Ovid, ko, I., Ranganathan, S., Science & Technology of Interfaces, TMS, pp.361-374, (2002).
DOI: 10.1002/9781118788103.ch31
Google Scholar
[8]
Lauridsen, E.M., The 3d X-ray diffraction microscope and its application to the study of recrystallization kinetics, Risø-Report-1266(EN), (2001).
Google Scholar
[9]
Duggan, B.J., L¨ucke, K., K¨ohlhoff, G., Lee, C.S., On the origin of cube texture in copper, Acta metall. mater. Vol. 41, pp.1921-1927, (1993).
Google Scholar
[10]
Samajdar, I., Doherty, R.D., Role of S[{123}< 634 >] orientations in the preferred nucleation of cube grains in recrystallization of fcc metals, Scripta metall. mater. Vol. 32, pp.845-850, (1995).
DOI: 10.1016/0956-716x(95)93212-m
Google Scholar
[11]
Bak, P., Tang, C., Wiesenfeld, K., Self-organized criticality: An explanation for 1/f noise, Phys. Rev. Lett. Vol. 59, pp.381-384, 1987. This article was processed using the LATEX macro package with TTP style.
DOI: 10.1103/physrevlett.59.381
Google Scholar
