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Electron Irradiation Damage in Stabilized Cubic Zirconia

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Abstract:

We report the formation of anomalous defect clusters in yttria stabilized zirconia (YSZ: 13 mol% Y2O3-ZrO2), which are a primary candidate for inert matrix fuels. Electron irradiation with 100 to 1000 keV is found to induce characteristic defect clusters. The defect clusters show strong black/black lobes contrast and multiply dislocations when the defect clusters grow to a critical diameter of 1.0-1.5 µm. Our analysis with transmission electron microscopy and numerical calculations lead to a conclusion that these defect clusters are charged oxygen platelets formed by the selective displacements of oxygen sublattice.

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Periodical:

Materials Science Forum (Volumes 475-479)

Pages:

1393-1396

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.475-479.1393

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Online since:

January 2005

Authors:

Kazuhiro Yasuda, C. Kinoshita, Syo Matsumura, A.I. Ryazanov

Keywords:

Charged Defect Clusters, Electron Irradiation, Oxygen, Selective Displacement Damage, Yttria Stabilized Zirconia (YSZ)

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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