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Silicon Carbide and Related Materials 2004

Materials Science Forum Volumes 483 - 485

• Papers
• Abstracts

• p929 Temperature Impact on High-Current 1.2kV SiC Schottky Rectifiers   [ 616 K ]
  Authors: Xavier Jordà, Dominique Tournier, Jose Rebollo, José Millán, Phillippe Godignon
• p933 Temperature Stability of Breakdown Voltage on SiC Power Schottky Diodes with Different Barrier Heights   [ 96 K ]
  Authors: R. Pierobon, G. Meneghesso, E. Zanoni, Fabrizio Roccaforte, Francesco La Via, Vito Raineri
• p937 Planar Schottky Microwave Diodes on 4H-SiC   [ 100 K ]
  Authors: Mattias Südow, Niklas Rorsman, Per Åke Nilsson, Herbert Zirath
• p941 Design, Fabrication and Characterization of 1.5 mΩcm₂, 800 V 4H-SiC n-Type Schottky Barrier Diodes   [ 668 K ]
  Authors: M. Furno, F. Bonani, G. Ghione, Sergio Ferrero, Samuele Porro, P. Mandracci, Luciano Scaltrito, Denis Perrone, G. Richieri, Luigi Merlin
• p945 Temperature Dependence of 4H-SiC JBS and Schottky Diodes after High Temperature Treatment of Contact Metal   [ 137 K ]
  Authors: R. Pérez, Narcis Mestres, Dominique Tournier, Xavier Jordà, Miquel Vellvehi, Phillippe Godignon
• p949 Numerical Analysis of SiC Merged PiN Schottky Diodes   [ 316 K ]
  Authors: T. Ayalew, Sang Cheol Kim, T. Grasser, S. Selberherr
• p953 New High-Voltage Unipolar Mode p⁺ Si/n^– 4H-SiC Heterojunction Diode   [ 65 K ]
  Authors: Tetsuya Hayashi, Hideaki Tanaka, Yoshio Shimoida, Satoshi Tanimoto, Masakatsu Hoshi
• p957 SiC Super Junction Power Devices: Modeling and Analysis   [ 243 K ]
  Authors: Z.J. Shen, X. Cheng, Beom Soo Kang, K. So, I. Hshieh
• p961 Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films   [ 430 K ]
  Authors: P.A. Losee, Can Hua Li, Joseph Seiler, Robert E. Stahlbush, T.P. Chow, I. Bhat, Ronald J. Gutmann
• p965 Drift-Free, 50 A, 10 kV 4H-SiC PiN Diodes with Improved Device Yields   [ 287 K ]
  Authors: Mrinal K. Das, Joseph J. Sumakeris, Brett A. Hull, James Richmond, Sumi Krishnaswami, Adrian R. Powell