Paper Titles
Preface
A Method for the Analysis of the Growth of Short Fatigue Cracks
p.3
Studies of SCC and Hydrogen Embrittlement of High Strength Alloys Using Fracture Mechanics Methods
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A Model for Crack-Induced Nucleation of Dislocations, Complex Stacking Faults and Twins
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Ideal Strength of Nano-Components
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Theoretical Strength of Metals and Intermetallics from First Principles
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Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
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Atomic Force Microscopy Study of the Early Fatigue Damage
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Mechanical Response of Semi-Brittle Nano Particles under an Imposed Cyclic Field
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Ideal Strength of Nano-Components

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Abstract:

The ideal (theoretical) strength was originally defined as the stress or strain at which perfect crystal lattice became mechanically unstable with respect to arbitrary homogeneous infinitesimal deformation. This has been intensely investigated because the ultimate strength without defects is a fundamental mechanical characteristic of materials. In the analyses, the instability criteria have been studied on the basis of elastic constants. Recent developments in computational technology make it possible to analyze the ideal strength on the basis of quantum mechanics. On the other hand, it is well known that the mechanical strength of components is dependent not only on (1) material (atom species), but also on (2) loading condition and (3) structure. Because most studies on the strength in terms of atomic mechanics have focused on the factor (1) (materials), analysis has mainly been conducted on simple crystal consisting of perfect lattices (e.g. fcc and bcc) under simple loading conditions (e.g. tension), though some have explored the properties of bulk materials with defects (e.g. vacancy and grain boundary). Small atomic components (nano-structured components) such as nano-films, nano-wires (tubes) and nano-dots (clusters) possess their own beautiful, defect-free structures, namely ideal structure. Thus, they show characteristic high strength. Moreover, utilizing the structure at the nanometer or micron level is a key technology in the development of electronic devices and elements of micro (nano) electro-mechanical systems (MEMS/NEMS). Therefore, it is important to understand the mechanical properties not only for the sake of scientific interest, but also for engineering usefulness such as design of fabrication/assembly processes and reliability in service. In the other words, the effects of structure (factor (3); e.g. film/wire/dot) have to be understood as the basic properties of atomic components. Thus, the definition of ideal strength should be expanded to include the strength at instability of components with ideal structures under various external loads (factor (2)), which provides fundamental knowledge of nano-structured materials. In this paper, we review works on the strength of ideal nano-structured components in terms of factor (3), mainly under tension.

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Periodical:

Materials Science Forum (Volume 482)

Pages:

25-32

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.482.25

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Online since:

April 2005

Authors:

Takayuki Kitamura, Yoshitaka Umeno, Akihiro Kushima

Keywords:

Ideal Structure, Instability, Low-Dimensional Component, Nanocomponent, Nanowire, Strength, Thin Film, Ultimate Strength

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] M. Born, Proc. Cambridge Phil. Mag., Vol. 36, (1940), p.160.

Google Scholar

[2] R.P. Vici and J.J. Vlassak, Ann. Rev. Matr. Sci., Vol. 26, (1996), p.431.

Google Scholar

[3] A.C.F. Cripps, Nanoindentation, Springer (2002).

Google Scholar

[4] S.P. Timoshenko and J.M. Gere, Theory of Elasticity, United Engineering Trustees (1936).

Google Scholar

[5] T. Kitamura, K. Yashiro and R. Ohtani, JSME International Journal, Ser. A, Vol. 40, (1997), p.430.

Google Scholar

[6] Y. Umeno and T. Kitamura, Materials Science and Engineering: B, Vol. B88, (2002), p.79.

Google Scholar

[7] J.W. Martin, J. Phys. C, Vol. 8, (1975), p.2837.

Google Scholar

[8] M. Sob, L.G. Wang and V. Vitek, Comp. Mater. Sci., Vol. 8, (1997), p.100.

Google Scholar

[9] K. Yashiro, M. Oho and Y. Tomita Comp. Mater. Sci., Vol. 29, (2004), p.397.

Google Scholar

[10] Y. Umeno, T. Kitamura and E. Matsui, J. Soc. Mat. Sci. Japan, Vol. 52, (2003), p.219, in Japanese.

Google Scholar

[11] K. Nakada, M. Fujita, G. Dresselhaus, and M.S. Dresselhaus, Phys. Rev., B, Vol. 54, (1996), p.17954.

Google Scholar

[12] K. Wakabayashi, M. Fujita, H. Ajiki, and M. Sigrist, Phys. Rev., B, Vol. 59, (1999), p.8271.

Google Scholar

[13] A.M. Affoune, B.L. V. Prasad, H. Sato, T. Enoki, Y. Kaburagi, and Y. Hishiyama, Chem. Phys. Lett., Vol. 348, (2001), p.17.

DOI: 10.1016/s0009-2614(01)01066-1

Google Scholar

[14] S. Horiuchi, T. Gotou, and M. Fujiwara, Appl. Phys. Lett., Vol. 84, (2004), p.2403.

Google Scholar

[15] D.W. Brenner, Phys. Rev. B, Vol. 42, (1990), p.9458.

Google Scholar

[16] M.J. Mehl and D.A. Papaconstantpoulos, Rev. B, Vol. 54, (1996), p.4519.

Google Scholar

[17] T. Kitamura, Y. Umeno, and N. Tsuji, Comp. Mater. Sci., Vol. 29, (2004), p.499.

Google Scholar

[18] T. Kitamura, Y. Umeno, and A. Kushima, Ψk Newsletter No. 63, (2004), p.73.

Google Scholar

[19] M. Okamoto, K. Takayanagi, Phys. Rev., B, Vol. 60, (1999), p.7808.

Google Scholar

[20] E. Ya. Glushko and V.A. Khrisanov, Low Temp. Phys., Vol. 23, (1997), p.910.

Google Scholar

[21] V. Derycke, P. Soukiassian, A. Mayne, G. Dujardin, and J. Gautier, Phys. Rev. Lett., Vol. 81, (1998), p.5868.

Google Scholar

[22] T. Kitamura and Y. Umeno, Modelling Simul. Mater. Sci. Eng., Vol. 11, (2003), p.127.

Google Scholar

[23] W. Fan, X.G. Gong, W.M. Lau, Phys. Rev., B, Vol. 66, (2002), p.115418.

Google Scholar

[24] S. Iijima, Nature, Vol. 354, (1991), p.56.

Google Scholar

[25] B.I. Yakobson, C.J. Brabec, and J. Bernholc, Phys. Rev. Lett., Vol. 76, (1996), p.2511.

Google Scholar

[26] M.B. Nardelli, B.I. Yakobsen, and J. Bernholc, Phys. Rev. Lett., Vol. 81, (1998), p.4656.

Google Scholar

[27] L. Yang and J. Han, Phys. Rev. Lett., Vol. 85, (2000), p.154.

Google Scholar

[28] D. Qian, G.J. Wagner, and W.K. Liu, Appl. Mech. Rev., Vol. 55, (2002), p.495.

Google Scholar

[29] S. Ogata and Y. Shibutani, Phys. Rev. B, Vol. 68, (2003), p.165409.

Google Scholar

[30] Y. Umeno, T. Kitamura and A. Kushima, Comp. Mater. Sci., to be published.

Google Scholar

[31] Y. Umeno, T. Kitamura and A. Kushima, Comp. Mater. Sci., to be published.

Google Scholar

[32] K. Raghavachari, J. Chem. Phys., Vol. 84, (1986), p.5672.

Google Scholar

[33] C. Zhao, J. Chem. Phys., Vol. 116, (2002), p.3690.

Google Scholar

[34] H.W. Kroto, J.R. Heath, S.C. O'Brien, R.F. Curl, and R.E. Smalley, Nature, Vol. 318, (1985), p.162.

Google Scholar

[35] A.D.J. Haymet, Chem. Phys. Lett., Vol. 122, (1985), p.421.

Google Scholar

[36] R.C. Haddon, L.E. Brus, and K. Raghavachari, Chem. Phys. Lett., Vol. 125, (1986), p.459.

Google Scholar

[37] A.J. Stone and D.J. Wales, Chem. Phys. Lett., Vol. 128, (1986), p.501.

Google Scholar