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Textures of Materials - ICOTOM 14

Materials Science Forum Volumes 495 - 497

• Papers
• Abstracts

• p99 Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption   [ 85 K ]
  Authors: I. Tomov
• p105 A PF Measurement Attachment of the Work-Piece for ODF Analysis   [ 99 K ]
  Authors: Qiu Lin Wu, Xiaojun Hu, Kemao Lv, Shu Bo Liu, Zuming Fu, Xiaomin Sun, Jian Min Wang, Limin Li
• p107 Quantitative Texture Measurements Using Neutron Time-Of-Flight Diffraction   [ 24 M ]
  Authors: Sven C. Vogel, Ch. Hartig, R.B. Von Dreele, H.R. Wenk, D.J. Williams
• p113 Quantitative Texture Analysis with the HIPPO TOF Diffractometer   [ 939 K ]
  Authors: J. Pehl, Siegfried Matthies, H.R. Wenk, Luca Lutterotti, Sven C. Vogel
• p119 Effect of Strong Neutron Absorption on Texture and Diffraction Data Analysis   [ 146 K ]
  Authors: H.M. Volz, Sven C. Vogel, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen
• p125 In Situ High Temperature Texture Characterisation in NiTi Shape Memory Alloy Using Synchrotron Radiation   [ 4 M ]
  Authors: Andersan S. Paula, Karimbi K. Mahesh, Francisco Manuel Braz Fernandes, Rui Miguel S. Martins, A.M.A. Cardoso, Norbert Schell
• p131 Texture Determination of Thin Cu-Wires by Synchrotron Radiation   [ 991 K ]
  Authors: Heinz Günter Brokmeier, Brigitte Weiss, Sang Bong Yi, Wenhai Ye Yi, K.D. Liss, T. Lippmann
• p137 Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation   [ 797 K ]
  Authors: Helmut Klein, Andrea Preusser, Lars Raue, Hans Joachim Bunge
• p143 Determination of Multipeak Textures with High-Energy Synchrotron Radiation   [ 881 K ]
  Authors: Andrea Preusser, Helmut Klein, Lars Raue, Hans Joachim Bunge
• p149 Quantification of Texture Inhomogeneity   [ 262 K ]
  Authors: Jan T. Bonarski