HOME CONTACT

Username: Password:

> @scientific.net

Textures of Materials - ICOTOM 14

Materials Science Forum Volumes 495 - 497

• Papers
• Abstracts

• p219 Unbiased Evaluation of Chord Length Distributions from Orientation Maps   [ 158 K ]
  Authors: Wolfgang Pantleon
• p225 Extension of Orientation Mapping to the Transmission Electron Microscope   [ 836 K ]
  Authors: David J. Dingley
• p231 Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data   [ 224 K ]
  Authors: H.S. Chen, Andrew Godfrey, Qing Liu
• p237 Three-Dimensional Texture Analysis   [ 1 M ]
  Authors: J.J.L. Mulders, A.P. Day
• p245 High Resolution Texture Analysis with Spherical Wavelets   [ 41 M ]
  Authors: Helmut Schaeben, Swanhild Bernstein, Ralf Hielscher, Judith Beckmann, Jens Keiner, Jürgen Prestin
• p255 Combined Synchrotron and Neutron Strcutural Refinement of R-Phase in Ti_50.75.Ni_47.75.Fe_1.50 Shape Memory Alloy   [ 228 K ]
  Authors: H. Sitepu, J.P. Wright, T. Hansen, Daniel Chateigner, Heinz Günter Brokmeier, Clemens Ritter, Takaomi Ohba
• p261 On Probability - Statistical Representation of Pole Figures for Materials with Hexagonal Symmetry   [ 446 K ]
  Authors: M.V. Borovkov, T.I. Savyolova
• p267 Determination of an ODF from Diffraction Measurements Based on Optimal Smoothing Splines   [ 316 K ]
  Authors: K.Gerald van den Boogaart, Ralf Hielscher
• p273 The Influence of Errors of X-Ray Texture Measurements on ODF Calculation with Central Normal Distribution Approximation   [ 54 K ]
  Authors: T.M. Ivanova, H.U. Lubman, T.I. Savyolova, Vladimir N. Serebryany
• p277 Common Basics of Mathematical Texture Analysis   [ 24 M ]
  Authors: Swanhild Bernstein, Ralf Hielscher, Helmut Schaeben