Engineering Tolerances & Performance in Applied EPD

Article Preview

Abstract:

For the past 10 years Cerel has been engaged in the development of prototype, EPDprocessed, micro-components, primarily for the microelectronics industry. In this contribution we summarize some of the problems of integrating EPD into the production process, and discuss the parameters that need to be considered and controlled. Suitable dispersion media and additives can usually be found for powder of any chemical composition to be deposited by EPD, providing the particle size and size distribution, and their surface to volume ratio are suitable. So it is the geometrical requirements and the dimensional tolerances of the product that often limit the EPD process. We give three examples: the EPD embedding of passive components in a punched ceramic tape, the production of porous capacitor anodes by EPD, and the EPD formation and printing of narrow conducting lines on a ceramic tape substrate. In each case the production process parameters have been chosen to satisfy the engineering requirements while minimizing the the formation of process defects. Defects include: variations in particle packing density; loss of adhesion and deposit cracking, and surface roughness or thickness variations.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

245-250

Citation:

Online since:

July 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] I. Zhitomirsky, JOM-e, 52(1) (2000).

Google Scholar

[2] C. Randall and J. Van Tassel, Encyclopedia of Materials Science & Technology, p.2733 (2001).

Google Scholar

[3] Robert J. Hunter, Foundations of Colloid Science 2nd ed. (OUP, 2001).

Google Scholar

[4] Partho Sarkar and Patrick S. Nicholson, J. Am. Ceram. Soc. 79(8), 1987 (1996).

Google Scholar

[5] J. Van Tassel and C.A. Randall, IMAPS (1997).

Google Scholar

[6] J. Van Tassel, Amit Daga and C.A. Randall, IMAPS (1999).

Google Scholar

[7] J. Van Tassel and C.A. Randall, J. Eur. Ceram. Soc. 19, 955 (1999).

Google Scholar

[8] C.A. Randall, J. Van Tassel, M. Matsko and C.P. Bowen, ISAF (1996).

Google Scholar

[9] W. Zhang & J.H. Schneibel, Acta Metall. Mater 43, 4377 (1995).

Google Scholar

[10] L. Klinger, Private communication (2005).

Google Scholar

[11] F. Wakai et al., Acta Materialia 53, 1361 (2005).

Google Scholar

[12] M. Zarbov et al. in these proceedings.

Google Scholar