Study on Nanometric Machining Process of Monocrystalline Si

Article Preview

Abstract:

A three-dimensional model of molecular dynamics (MD) was employed to study the nanometric machining process of Si. The model included the utilization of the Morse potential function and the Tersoff potential function to simulate the interatomic force between atoms. By analysis of snapshots and local radial distribution function (RDF) during the various stages of the cutting process, amorphous phase transformation of chip and machined surface are observed, but no phase transformation of bulk. Chip volume change is observed due to the amorphous phase transformation. Dislocations around the tool and elastic recovery of the machined surface do not appear. The effects of surface adsorption on machined surface state have been studied on the basis of surface energy and surfaces hardness. Surface energy decreases and hardness increases by adsorption. Oxygen atoms adsorbed are on the machined surface and subsurface region.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 315-316)

Pages:

792-795

Citation:

Online since:

July 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] K.E. Puttick, L.C. Whitmore, C.L. Chao and et al: Philos. Mag. A, Vol. 69 (1994) No. 1, pp.91-103.

Google Scholar

[2] L. Zhang and H. Tanaka: JSME Int. J.: Series A, Vol. 42 (1999) No. 4, pp.546-559.

Google Scholar

[3] S. Shimada, H. Tanaka and N. Ikawa: Proceeding of the 1st International Euspen Conference on Nano-tribology (Bremen, Germany, June 1-4, 1999).

Google Scholar

[4] R. Komanduri, N. Chandrasekaran and et al: Philos. Mag., Vol. 81 (2001) No. 12, p.1989-(2019).

Google Scholar

[5] Y. L, Tang, Y.C. Liang, D.H. Huo and K. Cheng: 4th International Conference, European Society of Precision Engineering And Nanotechnology (Glasgow, UK, May 30 - June 3, 2004).

Google Scholar

[6] J. Tersoff: Physical Review B, Vol. 39 (1989) No. 8, pp.5566-5568.

Google Scholar

[7] V.P. Bokarev: Crystallography Reports., Vol. 45 (2000) No. 3, pp.515-518.

Google Scholar

[8] S. Hong and M.Y. Chou: Physical Review B, Vol. 57 (1998) No. 11, pp.6262-6265.

Google Scholar

[9] Q. Zhao: Study on the Nanomachine based on AFM (Dissertation Harbin Institute of Technology, China 1999).

Google Scholar