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MSF - Authors (Klimke, J.)

ISSN: 1662-9752

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• p313 X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition
  Authors: Harm Wulff, H. Steffen, V. Krasemann, J. Klimke
• p295 Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry
  Authors: J. Klimke, Harm Wulff
• p442 High Temperature Grazing Incidence Studies on Aluminium Films
  Authors: J. Klimke, L. Fischer, Harm Wulff
• p392 Temperature and Time Resolved Studies of the Titanium Silicide Formatin with GIXRD abd GIXR
  Authors: L. Fischer, J. Klimke, Harm Wulff