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MSF - Authors (Koizumi, A.)

ISSN: 1662-9752

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• p921 Charge Collection Efficiency of 6H-SiC P⁺N Diodes Degraded by Low-Energy Electron Irradiation
  Authors: Naoya Iwamoto, Shinobu Onoda, Takeshi Ohshima, Kazutoshi Kojima, Atsushi Koizumi, Kazuo Uchida, Shinji Nozaki
• p201 Compensation-Dependent Carrier Transport of Al-Doped p-Type 4H-SiC
  Authors: Atsushi Koizumi, Naoya Iwamoto, Shinobu Onoda, Takeshi Ohshima, Tsunenobu Kimoto, Kazuo Uchida, Shinji Nozaki
• p267 Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency
  Authors: Naoya Iwamoto, Atsushi Koizumi, Shinobu Onoda, Takahiro Makino, Takeshi Ohshima, Kazutoshi Kojima, S. Koike, Kazuo Uchida, Shinji Nozaki