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MSF - Authors (Karwasz, G.P.)

ISSN: 1662-9752

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• p665 Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons
  Authors: Roberto S. Brusa, Grzegorz P. Karwasz, N. Tiengo, Antonio Zecca, F. Corni, C. Nobili, G. Ottaviani, R. Tonini
• p195 Defect Studies in Fe₃Al Alloys Doped with Cr, Mo and Si
  Authors: W. Deng, Roberto S. Brusa, Grzegorz P. Karwasz, Antonio Zecca
• p198 Influence of Mn and Fe on Defects in NiAl Alloy Investigated by Positron Annihilation Techniques
  Authors: W. Deng, Roberto S. Brusa, Grzegorz P. Karwasz, Antonio Zecca
• p466 Surfaces of SiO₂-Bi₂O₃ Glasses Studied by a Slow Positron Beam
  Authors: Grzegorz P. Karwasz, W. Deng, Roberto S. Brusa, Antonio Zecca, Maria Gazda, B. Kusz, K. Trzebiatowski, D. Pliszka
• p268 Comparative Study of Porosity in Low-k SiOCH Thin Films Obtained at Different Deposition Conditions
  Authors: Roberto S. Brusa, C.E. Macchi, Sebastiano Mariazzi, Monica Spagolla, Grzegorz P. Karwasz, Antonio Zecca