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MSF - Authors (Yamaguchi, H.)

ISSN: 1662-9752

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• p321 Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry
  Authors: Hirofumi Matsuhata, Hirotaka Yamaguchi, Ichiro Nagai, Toshiyuki Ohno, Ryouji Kosugi, Akimasa Kinoshita
• p671 TEM Observation of SiO₂/4H-SiC Hetero Interface
  Authors: Hirofumi Matsuhata, Junji Senzaki, Ichiro Nagai, Hirotaka Yamaguchi
• p251 Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography
  Authors: Ryohei Tanuma, Tae Tamori, Yoshiyuki Yonezawa, Hirotaka Yamaguchi, Hirofumi Matsuhata, Kenji Fukuda, Kazuo Arai
• p683 Voltage-Current (V-I) Characteristics of 1.5kV Class pn Junctions with p-Well Structures on (0001) 4H-SiC
  Authors: Ryouji Kosugi, T. Sakata, Y. Sakuma, K. Suzuki, Tsutomu Yatsuo, H. Matsuhata, Hirotaka Yamaguchi, Ichiro Nagai, Kenji Fukuda, Hajime Okumura, Kazuo Arai
• p707 EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes
  Authors: Takasumi Ohyanagi, Chen Bin, Takashi Sekiguchi, Hirotaka Yamaguchi, Hirofumi Matsuhata
• p789 Effects of Surface Morphological Defects and Crystallographic Defects on Reliability of Thermal Oxides on C-Face
  Authors: Takuma Suzuki, Hirotaka Yamaguchi, Tetsuo Hatakeyama, Hirofumi Matsuhata, Junji Senzaki, Kenji Fukuda, Takashi Shinohe, Hajime Okumura